Method of and device for inspecting pattern of printed circuit b

Details Method of and device for inspecting pattern of printed circuit b Method of and device for inspecting pattern of printed circuit b

1991-07-09

1992-09-22

Boudreau, Leo H.

Image analysis

Histogram processing

For setting a threshold

382 55, G06K 900

Patent

active

051504235

ABSTRACT:
An objective printed circuit board to be inspected has a printed conductive pattern (550) thereon. The image of the objective printed board is read with an image reader to obtain an image signal. Prior to the image reading of the objective printed board, a reference printed board of the same type as the objective printed board is prepared, and the image thereof is read with the image reader. An edge image of a conductive pattern on the reference printed board is extracted and enlarged to generate an enlarged edge image (SEI). In inspection of the objective printed board, only areas belonging to the enlarged edge image are actually inspected and other areas are not subjected to the inspection.

REFERENCES:
patent: 4692943 (1987-09-01), Pietzsch et al.
patent: 4980923 (1990-12-01), Kawamoto et al.

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