Semiconductor integrated circuit with error correction function

Details Semiconductor integrated circuit with error correction function Semiconductor integrated circuit with error correction function

1985-04-15

1987-11-10

Smith, Jerry

Excavating

371 30, G06F 1100

Patent

active

047062487

ABSTRACT:
A semiconductor integrated circuit has a judgment circuit incorporated to determine whether or not an error correction function has operated. In particular, this enables detection of the operating condition of the error correction function in an integrated circuit with an error correction function incorporated, through the addition of a simple circuit, and in turn enables checking of whether the device was originally of good quality, or is one repaired by the addition of an error correction function to a defective device.

REFERENCES:
patent: 4205301 (1980-05-01), Hisazawa
patent: 4277844 (1981-07-01), Hancock
patent: 4335459 (1982-06-01), Miller
patent: 4355391 (1982-10-01), Alsop
patent: 4417339 (1983-11-01), Cantarella
patent: 4498175 (1985-02-01), Nagumo
patent: 4507784 (1985-03-01), Procter
patent: 4561095 (1985-12-01), Kham
D. A. Beaven, "Error Correction on Very Large Scale Integrated Memory Chips", IBM Tech. Bulletin, vol. 22, No. 2B 1/1980.
G. Tate, "EDC Chip Boots Memory Reliability", Electronic Design 9/1980, vol. 28, No. 18, pp. 151-154.

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