High temperature microscope

Details High temperature microscope High temperature microscope

1986-05-27

1987-11-10

Punter, William H.

350247, 350319, B02B 2124, B02B 500, B02B 700

Patent

active

047053666

ABSTRACT:
A high temperature microscope having an optical system and a chamber system is disclosed. Frictional rotation of the peep window provided in the chamber system is caused together with frictional rotation of a first flange, in which the peep window is provided, and a second flange, which surrounds the first flange and is surrounded by a stationary third flange. It is thus possible to greatly delay the limit of the period, during which observation of the object can be made, due to fogging of the peep window. Double wall sealing ring members are provided between the first and second flanges and between the second and third flanges of the chamber of the high temperature microscope. The space between the double wall sealings can be evacuated through an inverted T-shaped ventilation hole provided in the second flange. Thus, the chamber can be evacuated to a superhigh vacuum higher than the vacuum degree obtainable in the chamber of the prior art high temperature microscope.

REFERENCES:
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patent: 2713725 (1973-01-01), Uesugi
patent: 3799657 (1974-03-01), Dager et al.
patent: 4121175 (1978-10-01), Hamil et al.
patent: 4388375 (1983-06-01), Hopper et al.
patent: 4409268 (1983-10-01), Inoue et al.
patent: 4501471 (1985-02-01), Culley et al.
patent: 4505546 (1985-03-01), Umeda et al.
patent: 4533214 (1985-08-01), Penz et al.
patent: 4586790 (1986-05-01), Umeda et al.
Grain Boundary Structure and Related Phenomena--Proceedings of Fourth Japan Institute of Metals--vol. 26, 1986, pp. 1-8--Kenji Abiko.

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