X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1991-05-22
1993-01-19
Hannaher, Constantine
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 57, 378 62, 378 70, 378146, 378901, 382 16, 382 22, 2504721, G01N 2304, G06K 946
Patent
active
051812347
ABSTRACT:
A pencil beam of X-rays is scanned over the surface of the body of a person being examined. X-rays that are scattered or reflected from the subject's body are detected by a detector. The signal produced by this scattered X-ray detector in then used to modulate an image display device to produce an image of the subject and any concealed objects carried by the subject. The detector assembly is constructed in a configuration to automatically and uniformly enhance the image edges of low atomic number (low Z) concealed objects to facilitate their detection. A storage means is provided by which previously acquired images can be compared with the present image for analyzing variances in similarities with the present image, and provides means for creating a generic representation of the body being examined while suppressing anatomical features of the subject to minimize invasion of the subject's privacy.
REFERENCES:
patent: Re28544 (1975-09-01), Stein et al.
patent: 4799247 (1989-01-01), Annis et al.
patent: 4864142 (1989-09-01), Gomberg
patent: 4974247 (1990-11-01), Friddell
patent: 5022062 (1991-06-01), Annis
Chu Kim-Kwok
Hannaher Constantine
IRT Corporation
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