Method of programming floating gate memory devices aided by pote

Static information storage and retrieval – Floating gate – Particular biasing

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365218, 257322, G11C 1134, G11C 700

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active

052474771

ABSTRACT:
Improved methods of programming floating gate memory devices such as MOS EPROMs having a gate, a floating gate, a read channel, and a write or programming channel. Potential is applied to the read channel (which is normally inactive during programming) in order to increase the voltage induced on the floating gate by the programming voltage applied to the gate. This makes it possible to reduce the programming voltage which must be applied to the gate, to reduce the time required to program the device, or to achieve some measure of both of these benefits.

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B. Eitan et al., "Hot-Electron Injection into the Oxide in n-Channel MOS Devices," IEEE Transactions on Electron Devices, vol. ED-28, No. 3, Mar. 1981, pp. 328-340.

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