Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1989-02-07
1990-04-17
Eisenzopf, Reinhard J.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
371 226, G01R 3100, G01R 3102
Patent
active
049183850
ABSTRACT:
Disclosed herein is a method and circuit useful in the testing of integrated circuit chips. On-chip test circuitry is provided at a selected location on an IC chip and energized while the chips are still mounted on a lead frame member, wound on reels and heated in an oven. Advantageously, the continuous lead frame member may be a tape automated bond (TAB bond) flexible circuit which is adapted for gang bonding to a large plurality of ICs before being wound on reels. In a preferred test circuit embodiment, the conductive on-off state of digital address circuity is controlled by applying a test signal potential to an input test pad and through a fuse to a common test circuit junction. This junction is in turn connected between a transistor and diode in a series control network which is operative to control the conductive state of the address circuitry. This network enables the input test pad to be used as both a test signal input connection and a ground connection for the IC test circuit.
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Burns W.
Eisenzopf Reinhard J.
Griffin Roland I.
Hewlett--Packard Company
Kassatly S. A.
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