Method of manufacturing a tip for scanning tunneling microscope

Details Method of manufacturing a tip for scanning tunneling microscope Method of manufacturing a tip for scanning tunneling microscope

1995-11-08

1996-08-13

Nelms, David C.

Dynamic information storage or retrieval

Specific detail of information handling portion of system

Electrical modification or sensing of storage medium

250306, 1566311, 1566471, 437228, G11B 900

Patent

active

055463754

ABSTRACT:
After a recessed portion 2 is formed in a first substrate made of single crystal silicon by crystal axis anisotropic etching, a peeling layer and a material of a fine tip which may be a noble metal or a noble metal alloy are formed. A second substrate is joined to the fine tip, and peeling is performed on the peeling layer, whereby the fine tip is formed on the second substrate.

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