Optical inspection system

Details Optical inspection system Optical inspection system

1975-06-17

1977-04-19

LaRoche, Eugene R.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

250209, 250223R, 250578, 356168, G01B 1124

Patent

active

040190501

ABSTRACT:
An optical inspection system is adapted to provide a null when an inspected object is of prescribed geometry. An optical beam forms an image of the object to be inspected and detectors are placed in pairs at like positions, dictated by the symmetry of the image, to exhibit like signals when those positions in the image actually are alike. The system is adaptable to assembly line operation by the placement of detectors at like positions with respect to each of two consecutive images similarly generating like signals when like portions of the images are identical.

REFERENCES:
patent: 2402405 (1946-06-01), Hurley, Jr.
patent: 2898801 (1959-08-01), Rockafellow
patent: 3529169 (1970-09-01), Heaney et al.
patent: 3546377 (1970-12-01), Troll
patent: 3549890 (1970-12-01), Keller
patent: 3563666 (1971-02-01), Foster
Rottman, Sequential Optical Inspection Technique, IBM Technical Disclosure Bulletin, vol. 8, No. 4, Sept. 1965, pp. 589, 590.

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