Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Patent
1989-10-04
1991-12-10
Evans, F. L.
Optics: measuring and testing
By dispersed light spectroscopy
With sample excitation
2504581, G01J 330, F21V 916
Patent
active
050712497
ABSTRACT:
A wavelength of light emitted from a semiconductor laser is shifted to a shorter wavelength with wavelength converting means and the resulting light of a shorter wavelength is applied to a sample. Upon exposure to the light of the shorter wavelength, the sample emits light of interest and its waveform is measured with measuring means. Fundamental wavelength laser light which passes through the waveform converting means is outputted therefrom in synchronism with the light of a shorter wavelength and detected by a first photodetector. The waveform of the light of interest can be measured correctly on the basis of an output signal from the first photodetector.
REFERENCES:
patent: 4959665 (1989-08-01), Saito et al.
Stavola et al., "Picosecond Time Delay Fluorimetry Using Jitter-Free Streak Camera," Optic Communications, 9/19/80, vol. 34, #3, pp. 404-408.
Yamazaki et al., "Microchannel-Plate Photomultiplier Applicability to the Time-Correlated Photon Counting Method," Rev. Sci. Instrum, 56(6), pp. 1187-1194, (Jun. 1985).
Sumitani et al., "Channel-Three Decay in Benzene: A Picosecond Flourescence Investigation", Chemical Physics 93, pp. 359-371, 1985.
Taniuchi et al., "Second Harmonic Generation by Cherenkov Radiation in Proton-Exchanged LiNbO.sub.3 Optical Waveguide", Technical Digest CLEO, pp. 230-231, 1986.
Technical Note: Measurement by 00S-01/VIS, Hamamatsu, pp. 1-16, Nov. 1988.
Technical Note: Application Example of PLP-01, Hamamatsu, Catalog No.: TV-169, Jan. 1989.
Absolute Two Photon Fluorescence with Low Power CW Lasers, Catalano et al., American Institute of Physics, Applied Physics Letter, 5/81, pp. 745-747.
Koishi Musubu
Takahashi Akira
Tsuchiya Yutaka
Evans F. L.
Hamamatsu Photonics K.K.
Hantis K. P.
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