Method of three-dimensional measurement with few projected patte

Details Method of three-dimensional measurement with few projected patte Method of three-dimensional measurement with few projected patte

1985-11-04

1987-03-10

Evans, F. L.

Optics: measuring and testing

By polarized light examination

With light attenuation

356375, 250558, G01B 1124

Patent

active

046487174

ABSTRACT:
Methods are provided for reducing the number of projected patterns required to make two- or three-dimensional surface measurements on a sub-class of surfaces comprising relatively smooth surfaces. By including apriori knowledge about the surface to be measured, pattern ambiguities can be resolved by processing rather than by additional projected patterns.

REFERENCES:
patent: 4175862 (1979-11-01), DiMatteo et al.
patent: 4259589 (1981-03-01), DiMatteo et al.

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