Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1990-01-24
1991-09-03
Wieder, Kenneth
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324690, 324685, G01R 2726
Patent
active
050457985
ABSTRACT:
A planar interdigitated dielectric sensor useful for measuring the surface properties of a material is disclosed. The sensor is formed on an insulating substrate. Attached to the surface of the substrate is an excitation and response electrode disposed in an interdigitated pectinate configuration. Filling the space between the electrodes is an insulating material of known dielectric properties. The upper surface of the electrodes are generally coplanar with respect to the insulating material between the electrodes thus forming a flat upper surface on the sensor. This flat upper surface serves to eliminate air gaps between the sensor surface and sample when analyzing relatively viscous materials.
REFERENCES:
patent: 2219497 (1940-10-01), Stevens
patent: 3696360 (1972-10-01), Gajewski
patent: 3879644 (1975-04-01), Maltby
patent: 3882381 (1975-05-01), Gregory
patent: 4423371 (1983-12-01), Senturia
patent: 4510436 (1985-04-01), Raymond
patent: 4654598 (1987-03-01), Arulanandan
patent: 4710550 (1987-12-01), Kranbuehl
patent: 4723908 (1988-02-01), Kranbuehl
Society for the Advancement of Material and Process Engineering Journal, vol. 19, No. 4 Jul./Aug. 1983.
Solis Jose M.
TA Instruments, Inc.
Wieder Kenneth
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