4. Optics: measuring and testing
  5. By dispersed light spectroscopy
  6. With raman type light scattering

Ze Xiang Shen

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Apertureless near-field scanning raman microscopy using...

Optics: measuring and testing – By dispersed light spectroscopy – With raman type light scattering
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Method to form C54 TiSi2 for IC device fabrication

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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