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Yuzo Nakamura

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Details Yuzo Nakamura Yuzo Nakamura

: Photography and optical equipment
: Optical article not elsewhere specified
: Microscope

: Inventor
: active

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Apparatus for inspecting a substrate

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material

Reexamination Certificate

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Apparatus for inspecting a substrate

Optics: measuring and testing – By alignment in lateral direction

Reexamination Certificate

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Apparatus for inspecting a substrate

Optics: measuring and testing – Inspection of flaws or impurities

Reexamination Certificate

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Atomic force microscope

Optical: systems and elements – Compound lens system – Microscope

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Egg sorting and packing device

Package making – With means responsive to a sensed condition – Of individual contents or group feed or delivery

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Profile ID: LFUS-PAI-P-414222

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