4. X-ray or gamma ray systems or devices
  5. Specific application
  6. Diffraction, reflection, or scattering analysis

Yuriy Platonov

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Method and apparatus for detecting boron in x-ray...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Multi-layer structure with variable bandpass for...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Multi-layer structure with variable bandpass for...

Optical: systems and elements – Diffraction – From grating
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Protective layer for multilayers exposed to x-rays

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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X-ray phase contrast imaging using a fabry-perot...

X-ray or gamma ray systems or devices – Specific application – Holography or interferometry
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Profile ID: LFUS-PAI-P-2584818

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