4. Measuring and testing
  5. Surface and cutting edge testing
  6. Roughness

Yung-Shi Lin

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High molecular weight information recording medium and related d

Radiation imagery chemistry: process – composition – or product th – Liquid crystal process – composition – or product
Patent

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High-sensitivity strain probe

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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High-sensitivity strain probe

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Profile ID: LFUS-PAI-P-626500

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