4. Optics: measuring and testing
  5. By light interference
  6. Having partially reflecting plates in series

Yun Suk Jung

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Chip-scale optical spectrum analyzers with enhanced resolution

Optics: measuring and testing – By light interference – Having partially reflecting plates in series
Reexamination Certificate

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Metal nanowire based bandpass filter arrays in the optical...

Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system
Reexamination Certificate

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Surface plasmon-enhanced nano-optic devices and methods of...

Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system
Reexamination Certificate

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