4. Measuring and testing
  5. Hardness
  6. By penetrator or indentor

Yun-hee Lee

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Apparatus for determining residual stress, method for...

Measuring and testing – Hardness – By penetrator or indentor
Reexamination Certificate

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Apparatus for indentation test and method for measuring...

Measuring and testing – Hardness – By penetrator or indentor
Reexamination Certificate

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Semiconductor device having multi-layered pad and a...

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate

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Semiconductor device having temporary signal storage unit

Television – Camera – system and detail – Solid-state image sensor
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2729002

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