4. Static information storage and retrieval
  5. Read/write circuit
  6. Bad bit

Young-Ho Seol

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Memory repair circuit using antifuse of MOS structure

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Repair circuit using antifuse

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2440420

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