4. Geometrical instruments
  5. Gauge
  6. With support for gauged article

Yoshio Saruki

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Measuring instrument, probe for the same, and measuring method

Geometrical instruments – Gauge – With support for gauged article
Patent

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Measuring instrument, probe for the same, and measuring method

Geometrical instruments – Gauge – Movable contact probe – per se
Reexamination Certificate

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Optical interferometric measuring instrument and laser...

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Surface profile measurement apparatus

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1696127

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