4. Image analysis
  5. Histogram processing
  6. For setting a threshold

Yoshinori Sezaki

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Method and apparatus for inspecting line width on printed board

Image analysis – Histogram processing – For setting a threshold
Patent

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Method of and apparatus for inspecting pattern on printed board

Boots – shoes – and leggings
Patent

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Method of and apparatus for inspecting width of wiring line on p

Boots – shoes – and leggings
Patent

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Method of and apparatus for inspecting wiring pattern on printed

Image analysis – Histogram processing – For setting a threshold
Patent

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Pattern masking method and an apparatus therefor

Image analysis – Histogram processing – For setting a threshold
Patent

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Profile ID: LFUS-PAI-P-522478

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