4. Optics: measuring and testing
  5. By light interference
  6. Using fiber or waveguide interferometer

Yoshikatsu Morishima

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Optical coherence tomographic imaging apparatus

Optics: measuring and testing – By light interference – Using fiber or waveguide interferometer
Reexamination Certificate

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Optical tomography apparatus

Optics: measuring and testing – By light interference – Using fiber or waveguide interferometer
Reexamination Certificate

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Super luminescent diode and manufacturing method thereof

Active solid-state devices (e.g. – transistors – solid-state diode – Incoherent light emitter structure – With heterojunction
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2168200

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