4. Optics: measuring and testing
  5. Inspection of flaws or impurities

Yogesh Mehrotra

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Apparatus and method for viewing and inspecting a circumferentia

Optics: measuring and testing – Inspection of flaws or impurities
Patent

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Apparatus and method for viewing and inspecting a circumferentia

Optics: measuring and testing – Inspection of flaws or impurities
Patent

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Apparatus for viewing and inspecting a surface area of an...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Method of manufacturing low thermal expansion modified cordierit

Plastic and nonmetallic article shaping or treating: processes – Including step of generating heat by friction
Patent

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Profile ID: LFUS-PAI-P-1220805

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