4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

Yian Leng Chang

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Locating an image of an object having a concentric profile

Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate

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Method and apparatus for locating ball grid array packages from

Image analysis – Applications – Manufacturing or product inspection
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Method and apparatus for locating ball grid array packages...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Object image search using sub-models

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1353258

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