4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

Yasushi Hiruma

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Semiconductor device inspection system

Image analysis – Applications – Manufacturing or product inspection
Patent

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Semiconductor device inspection system involving superimposition

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Profile ID: LFUS-PAI-P-1062057

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