4. Measuring and testing
  5. Specimen stress or strain, or testing by stress or strain...
  6. By loading of specimen

William Humphries

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Method for apparatus for determining measurement parameter of a

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Methods and apparatus for determining a first parameter(s)...

Measuring and testing – Specimen stress or strain – or testing by stress or strain... – By loading of specimen
Reexamination Certificate

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Multispectral optical detection device and method

Measuring and testing – Specimen stress or strain – or testing by stress or strain... – By loading of specimen
Patent

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Profile ID: LFUS-PAI-P-1632729

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