4. Optics: measuring and testing
  5. By dispersed light spectroscopy

Wayne E. Rodgers

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Apparatus and method for thin film deposition onto substrates

Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
Reexamination Certificate

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Spectrometry detector head and fiber optic connector

Optics: measuring and testing – By dispersed light spectroscopy
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Profile ID: LFUS-PAI-P-1196917

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