4. Electricity: measuring and testing
  5. Testing potential in specific environment
  6. Voltage probe

Walter O. LeCroy, Jr.

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High-speed sampling arrangement and apparatus using same

Coded data generation or conversion – Digital code to digital code converters – Serial to parallel
Patent

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High-speed switching tree with input sampling pulses of constant

Coded data generation or conversion – Sample and hold – Having variable sampling rate
Patent

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Test probe

Electricity: measuring and testing – Testing potential in specific environment – Voltage probe
Patent

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Profile ID: LFUS-PAI-P-1122259

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