4. Data processing: measuring, calibrating, or testing
  5. Measurement system in a specific environment
  6. Quality evaluation

Walter Juri

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Arrangement of electronic components on a bearer strip

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – With contact or lead
Reexamination Certificate

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Test procedure and test station for carrying out the test proced

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
Patent

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Profile ID: LFUS-PAI-P-1644285

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