4. X-ray or gamma ray systems or devices
  5. Specific application
  6. Diffraction, reflection, or scattering analysis

Vladimir V. Martynov

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Multi-layer structure with variable bandpass for...

Optical: systems and elements – Diffraction – From grating
Reexamination Certificate

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Multi-layer structure with variable bandpass for...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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X-ray phase contrast imaging using a fabry-perot...

X-ray or gamma ray systems or devices – Specific application – Holography or interferometry
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2584817

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