4. Static information storage and retrieval
  5. Floating gate
  6. Particular biasing

Vincent C. Leung

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High voltage NMOS pass gate for integrated circuit with high vol

Static information storage and retrieval – Floating gate – Particular biasing
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Integration of embedded and test mode timer

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1817796

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