4. Optics: measuring and testing
  5. Inspection of flaws or impurities
  6. Having predetermined light transmission regions

Victor A. Scheff

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Circuit protection devices

Electrical resistors – Resistance value responsive to a condition – Current and/or voltage
Patent

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Inspection system with in-lens, off-axis illuminator

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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Spatial filter for optically based defect inspection system

Radiant energy – Photocells; circuits and apparatus – Interference pattern analysis
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