4. Optics: measuring and testing
  5. Lamp beam direction or pattern

Toshiyuki Kaya

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Apparatus for measuring optical-axis deflection angle of headlig

Optics: measuring and testing – Lamp beam direction or pattern
Patent

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Coating defect detecting and marking system

Coating apparatus – Projection or spray type – Moving projector
Reexamination Certificate

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Flicker correction apparatus and flicker correction method,...

Television – Camera – system and detail – Combined image signal generator and general image signal...
Reexamination Certificate

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Wheel alignment measuring apparatus

Optics: measuring and testing – Range or remote distance finding – With photodetection
Patent

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Profile ID: LFUS-PAI-P-1413009

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