4. Measuring and testing
  5. Inspecting

Toshihiro Yonezawa

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Apparatus for aligning a semiconductor wafer with an inspection

Optics: measuring and testing – By alignment in lateral direction
Patent

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Inspection apparatus, transportation apparatus, and temperature

Measuring and testing – Inspecting
Patent

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Mechanism for fixing probe card

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reissue Patent

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Mechanism for fixing probe card

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate

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Mechanism for fixing probe card

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reissue Patent

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Profile ID: LFUS-PAI-P-540067

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