4. Alloys or metallic compositions
  5. Tin base
  6. Copper containing

Toshihiro Hachiya

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Electron device and semiconductor device

Alloys or metallic compositions – Tin base – Copper containing
Reexamination Certificate

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Electronic device

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2616106

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