4. Data processing: measuring, calibrating, or testing
  5. Measurement system in a specific environment
  6. Quality evaluation

Toshiaki Yachi

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Automatic contaminants detection apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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System for quality control where inspection frequency of inspect

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
Patent

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Profile ID: LFUS-PAI-P-1063820

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