4. Image analysis
  5. Learning systems
  6. Trainable classifiers or pattern recognizers

Timothy L. Hutcheson

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Apparatus for generating a feature matrix based on normalized ou

Image analysis – Histogram processing – For setting a threshold
Patent

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Electron beam inspection system and method

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Patent

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Method and apparatus for determining and organizing feature vect

Image analysis – Histogram processing – For setting a threshold
Patent

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Pattern recognition system

Image analysis – Learning systems – Trainable classifiers or pattern recognizers
Patent

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