4. Electronic digital logic circuitry
  5. Multifunctional or programmable
  6. Array

Timothy G. Dunham

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AB etch endpoint by ABFILL compensation

Semiconductor device manufacturing: process – Chemical etching
Reexamination Certificate

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Autonomic graphical partitioning

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Methodology to improve turnaround for integrated circuit...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Reducing number of relatively unimportant shapes from a set...

Image analysis – Applications – Manufacturing or product inspection
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Removal of relatively unimportant shapes from a set of shapes

Image analysis – Applications – Manufacturing or product inspection
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Profile ID: LFUS-PAI-P-2212923

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