Optics: measuring and testing
Inspection of flaws or impurities
Inventor
active
Pattern inspecting method and pattern inspecting apparatus
Pattern inspecting method and pattern inspecting apparatus
No associations
LandOfFree
Takuro Nagao does not yet have a rating. At this time, there are no reviews or comments for this inventor.
If you have personal experience with Takuro Nagao, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Takuro Nagao will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-P-2352074