4. Thermal measuring and testing
  5. Temperature measurement
  6. In spaced noncontact relationship to specimen

Takamitsu Takayama

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Ellipsometer and method of controlling coating thickness therewi

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

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Method and apparatus for measuring temperature using an optical

Thermal measuring and testing – Temperature measurement – In spaced noncontact relationship to specimen
Patent

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Temperature measuring device

Thermal measuring and testing – Temperature measurement – In spaced noncontact relationship to specimen
Patent

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Profile ID: LFUS-PAI-P-728243

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