Image analysis
Applications
Manufacturing or product inspection
Inventor
active
Image processing unit for wafer inspection tool
Image processing unit for wafer inspection tool
Inspection apparatus for inspecting patterns of a substrate
No associations
LandOfFree
Takako Fujisawa does not yet have a rating. At this time, there are no reviews or comments for this inventor.
If you have personal experience with Takako Fujisawa, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Takako Fujisawa will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-P-3125605