4. Data processing: measuring, calibrating, or testing
  5. Measurement system
  6. Statistical measurement

Suresh R. Puthucode

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Determining the failure rate of an integrated circuit

Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement
Reexamination Certificate

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Providing optimal supply voltage to integrated circuits

Miscellaneous active electrical nonlinear devices – circuits – and – Specific identifiable device – circuit – or system – With specific source of supply or bias voltage
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2700658

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