4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

Suneel Tumkur Shankarappa

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Method for performing model based scanplan generation of a...

Measuring and testing – Instrument proving or calibrating – Displacement – motion – distance – or position
Reexamination Certificate

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System and method for analyzing and identifying flaws in a...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Profile ID: LFUS-PAI-P-3063335

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