4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Heterojunction device
  6. With lattice constant mismatch

Sudhir G. Subramanya

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Methods for the automated testing of reticle feature geometries

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices
Reexamination Certificate

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Process for growing epitaxial gallium nitride and composite...

Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – With lattice constant mismatch
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2562582

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