4. Image analysis
  5. Histogram processing
  6. For setting a threshold

Steve Buchholz

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Automatic system and method for inspecting hole quality

Image analysis – Histogram processing – For setting a threshold
Patent

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Photomask inspection apparatus and method with improved defect d

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Profile ID: LFUS-PAI-P-470198

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