4. X-ray or gamma ray systems or devices
  5. Specific application
  6. Absorption

Steen Teller

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Method and apparatus for determining the position of an...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Method of determining the density profile

X-ray or gamma ray systems or devices – Specific application – Absorption
Patent

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Method of determining the density profile of a plate-shaped mate

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Profile ID: LFUS-PAI-P-1404884

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