4. Data processing: measuring, calibrating, or testing
  5. Measurement system in a specific environment
  6. Electrical signal parameter measurement system

Stanley Edward Jaffe

Inventor

Rate now
  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Inventor

active

Enhanced signal analysis in an amplitude versus frequency...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Rapid graphical analysis of waveforms using a pointing device

Data processing: presentation processing of document – operator i – Operator interface – On-screen workspace or object
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Stanley Edward Jaffe does not yet have a rating. At this time, there are no reviews or comments for this inventor.

If you have personal experience with Stanley Edward Jaffe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Stanley Edward Jaffe will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-P-2779801

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

 Charities
 Companies
 MP Candidates
 Patents
 Employee Salary Disclosure

World

 Places of the World
 Scientific Papers

United States

 Banks
 Companies
 Counties
 Patents
 Employee Salary Disclosure