4. Brushing, scrubbing, and general cleaning
  5. Machines
  6. With air blast or suction

Soo-Min Byun

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Apparatus and method for cleaning probe card contacts

Brushing – scrubbing – and general cleaning – Machines – With air blast or suction
Reexamination Certificate

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Probe needle test apparatus and method

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2783074

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