4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Shi-Huei Liu

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Low power SRAM redundancy repair scheme

Static information storage and retrieval – Systems using particular element – Flip-flop
Reexamination Certificate

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Wafer level burn-in for memory integrated circuit

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2649369

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