4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Seok-won Hwang

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Circuits and methods for generating high frequency extended...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Methods of modifying operational characteristic of memory...

Static information storage and retrieval – Read/write circuit – Plural use of terminal
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2791372

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