4. Optics: measuring and testing
  5. Inspection of flaws or impurities
  6. Surface condition

Sang-bong Choi

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Apparatus and method for contact failure inspection in...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Method and apparatus for detecting thickness of thin layer...

Radiant energy – Photocells; circuits and apparatus – With circuit for evaluating a web – strand – strip – or sheet
Reexamination Certificate

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Method of and device for detecting micro-scratches

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Method of and device for detecting micro-scratches

Semiconductor device manufacturing: process – With measuring or testing – Optical characteristic sensed
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Method of measuring etched state of semiconductor wafer...

Semiconductor device manufacturing: process – With measuring or testing – Optical characteristic sensed
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Profile ID: LFUS-PAI-P-2433874

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